SEMICONDUCTOR CIRCUIT DEVICE AND METHOD FOR TESTING AND REPAIRING MEMORIES EMBEDDED THEREIN

摘要

The present invention relates to a semiconductor circuit device and a method for inspecting and repairing memories embedded therein. The semiconductor circuit device according to an embodiment of the present invention may include: a plurality of the memories; an inspection unit which obtains information of the number of failed cells in each memory by inspecting the memories and also obtains location information of the failed cells in each memory; and a repair unit which repairs memories with failure based on the information of the number of failed cells and the location information.