AN INTEGRATED CIRCUIT SEMICONDUCTOR DEVICE HAVING BUILT-IN SELF-REPAIR CIRCUIT FOR EMBEDDED MEMORY AND A METHOD FOR REPAIRING THE MEMORY

摘要

An integrated circuit semiconductor device having a self-healing circuit for an embedded memory disclosed herein includes row and column fill entries for storing information required to perform a row and column recovery of bad cells generated in the embedded memory. do. The row and column fill entries are sized according to the number of row / column redundancy of the internal memory. The row and column fill entries respectively store row and column address information corresponding to the location where the bad cell is generated, and indicate the other's fill entry. Built-in pointer The self-recovery circuit may leave only the information to be recovered in the fill entries and delete the remaining information in order to perform the repair of the defective cell, and then the row for the bad cell generated in the internal memory by the last remaining fill entry information. Perform column recovery.