A Single-Configuration Method for Application-Dependent Testing of SRAM-based FPGA Interconnects

摘要

This paper presents a new method for application-dependent testing of SRAM-based FPGA interconnects at run time. This method utilizes new features related to the function for the programming of the LUTs, the utilization (by logic activation/deactivation) of the nets in a interconnect configuration as well as the primary (unused) IOs of the FPGAs. A new LUT programming function is introduced, the proposed method retains the original interconnect configuration and modifies the function of the LUTs using the so-called 1-Bit Sum Function (1-BSF), the 1-BSF detects all possible stuck-at and bridging faults (of all cardinalities) by utilizing the all zeros'' vector and a walking-1 test set. As validated by simulation for benchmark circuits (implemented on the Xilinx Virtex4), the proposed method results in a single test configuration with 100% coverage under the assumed fault model.