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Suppression of wear in cyclically loaded polycrystalline silicon MEMS via a thin silicon carbide coating

机译:通过薄的碳化硅涂层抑制循环加载的多晶硅MEMS的磨损

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The surfaces of a microfabricated polysilicon test structure, designed to measure adhesion forces in MEMS, were modified with a thin (∼50 nm) silicon carbide coating to take advantage of the outstanding tribological, electrical, and chemical properties of polycrystalline SiC (polySiC). Adhesion forces in polySiC-coated interfaces as a function of apparent area of contact have been determined quantitatively and compared to those in uncoated polycrystalline silicon (polySi) contacts. A detailed study of changes in physico-chemical surface properties after >100 billion contact cycles is also presented, highlighting suppression of wear upon SiC coating.
机译:为了测量MEMS中的粘附力而设计的微型多晶硅测试结构的表面,用薄的碳化硅涂层(约50 nm)进行了修饰,以利用多晶SiC(polySiC)的出色的摩擦学,电学和化学性能。已定量确定了在SiC涂层界面中作为表观接触面积的函数的粘合力,并将其与未涂层的多晶硅(polySi)触点中的粘合力进行了比较。还介绍了在> 1000亿次接触循环后理化表面性质变化的详细研究,重点介绍了抑制SiC涂层磨损的方法。

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