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VDMOS modeling for IC CAD

机译:用于IC CAD的VDMOS建模

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摘要

The VDMOS physical modeling method is studied, and then a VDMOS physical model is proposed for IC CAD. In this model, for the region whose cross-section area of electron flow is variable, a differential equation for the vertical electric field, which considers the high electric field's strong influence on the electron mobility, is established. Moreover, when the nonuniform electron concentration distribution is considered, this differential equation is solved by the analytical method. In addition, for the region whose cross-section area of electron flow is invariable, the analytical formula of vertical electric field is derived approximately by proper simplification. The calculation results show that in comparison to the Yeong-seuk Kim et al's model, the calculation precision of this model is greatly improved. Especially when both the gate voltage and the drain voltage are high, its improvement is remarkable.
机译:研究了VDMOS物理建模方法,然后提出了用于IC CAD的VDMOS物理模型。在该模型中,对于电子流截面积可变的区域,建立了考虑高电场对电子迁移率的强烈影响的垂直电场的微分方程。此外,当考虑非均匀电子浓度分布时,该微分方程通过解析方法求解。另外,对于电子流的截面积恒定的区域,通过适当的简化近似地导出垂直电场的解析式。计算结果表明,与Yeong-seuk Kim等人的模型相比,该模型的计算精度大大提高。特别是当栅极电压和漏极电压都很高时,其改善是显着的。

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