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MEMS-compatible high-density trench capacitor with ultra-conformal Cu/SiO2 layers by supercritical fluid deposition

机译:通过超临界流体沉积获得具有超共形Cu / SiO 2 层的MEMS兼容高密度沟槽电容器

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We have successfully fabricated a 3D super-capacitor, which can be integrated with MEMS in a wafer level, using Si trenches (aspect ratio = 53) and ultra-conformal supercritical fluid deposition (SCFD) of Cu/SiO2 layers. Taking advantage of large inner surface area of the trenches, the 3D capacitor exhibited 70 times larger capacitance than a planar one having the same projected area, and low leakage current density (<;3.8×10-5 A/cm2) at an electric field of 1.5-2.4 MV/cm. This achievement is brought about by ultra-conformal and void-free coating of a SiO2 layer, having a dielectric constant equivalent to the film by conventional deposition method, and ultra-conformal deposition of Cu on oxide surface, both of which are significant achievements for SCFD. Metal-insulator-metal structure is also feasible using a similar process technology, which will allow us monolithic integration of a power storage element, a power generator and sensors in a single MEMS chip for the purpose of battery-free sensor nodes in sensor network.
机译:我们已经成功制造了3D超级电容器,该超级电容器可以使用Si沟槽(纵横比= 53)和Cu / SiO 2的超共形超临界流体沉积(SCFD)在晶圆级与MEMS集成在一起图层。利用沟槽的大内表面积,该3D电容器的电容是具有相同投影面积的平面电容器的70倍,并且漏电流密度低(<; 3.8×10 -5 A / cm 2 )在1.5-2.4 MV / cm的电场下。这一成就是通过对SiO 2 层进行超适形和无孔的涂覆而实现的,该SiO 2 层的介电常数与常规沉积方法的薄膜等效,并且在氧化物表面上超适形地沉积了Cu ,这对于SCFD都是重要的成就。使用类似的工艺技术,金属-绝缘体-金属结构也是可行的,这将使我们能够在单个MEMS芯片中将蓄电元件,发电器和传感器进行单片集成,以实现传感器网络中无电池的传感器节点的目的。

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