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Optical and Electrical Simulation of 4H-SiC UV Photodetector by Finite Element Method

机译:有限元方法对4H-SiC紫外光电探测器的光电模拟

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This paper focuses on UV-photodetector simulation. The calculus method description and the physical equations which occur in this model are presented as well as the UV-photodetector structure (p~+n~-n~+ diode). Based on the Finite Element Method the electrical part solves the continuity and Poisson equation, and the optical part solves by Maxwell's equation, FDTD [1]. Simulation works point out the influence of the p~+-type layer on the electrical characteristics such as the current densities versus reverse bias. Indeed, simulation results show the current density increase with the decrease doping concentration or the p~+-type layer thickness.
机译:本文着重于紫外光检测器的仿真。介绍了该模型中的演算方法描述和物理方程式,以及紫外光电探测器的结构(p〜+ n〜-n〜+二极管)。基于有限元方法,电气部分求解连续性和泊松方程,光学部分通过麦克斯韦方程FDTD [1]求解。仿真工作指出了p〜+型层对电特性(例如电流密度与反向偏置)的影响。实际上,仿真结果表明电流密度随掺杂浓度或p〜+型层厚度的减小而增加。

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