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Process variation tolerant all-digital multiphase DLL for DDR3 interface

机译:DDR3接口的耐过程变化的全数字多相DLL

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An all-digital multiphase DLL is presented that is robust to delay mismatch due to process variation. Each of four 90° phase shift blocks accurately align each phase to 90° delay using its own ring oscillator and locking delay code. Harmonic locking is protected by a ring oscillator and a counter. An area efficient binary to thermometer converter is proposed to diminish the area overhead due to four delay line controllers. An edge combiner is used for duty cycle correction and clock 2x multiplications. The measured large locking delay code difference between four 90° phase shift delay lines in the proposed DLL implemented in 45nm CMOS process, which corresponds to ±31ps at 800MHz, proves that the DLL corrects significant phase error caused by delay mismatch. Phase shift accuracy errors at 90° and 270° phases are 0.43° and 1.01°, respectively, and output frequency is 1.6GHz with 50% duty cycle at 800MHz. Power consumption is 3.3mW at 800MHz.
机译:提出了一种全数字多相DLL,该DLL具有强大的抗延迟能力,可以防止由于工艺变化而引起的延迟失配。四个90°相移块中的每一个都使用自己的环形振荡器和锁定延迟代码将每个相位精确地对准90°延迟。谐波锁定由环形振荡器和计数器保护。提出了一种面积有效的二进制至温度计转换器,以减少由于四个延迟线控制器​​而导致的面积开销。边缘组合器用于占空比校正和时钟2x乘法。在以45nm CMOS工艺实现的拟议DLL中,在四条90°相移延迟线之间测得的较大的锁定延迟代码差(对应于800MHz处的±31ps),证明DLL纠正了由延迟失配引起的明显相位误差。 90°和270°相位的相移精度误差分别为0.43°和1.01°,输出频率为1.6GHz,占空比为800MHz时为50%。在800MHz时功耗为3.3mW。

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