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Measurement circuits for acquiring SET pulsewidth distribution with sub-FO1-inverter-delay resolution

机译:用于以亚FO1逆变器延迟分辨率获取SET脉宽分布的测量电路

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This paper presents two circuits to measure pulse width distribution of single event transients (SETs). We first review requirements for SET measurement in accelerated neutron radiation test and point out problems of previous works, in terms of time resolution, time/area efficiency for obtaining large samples and certainty in absolute values of pulse width. We then devise two measurement circuits and a pulse generator circuit that satisfy all the requirements and attain sub-FO1-inverter-delay resolution, and propose a measurement procedure for assuring the absolute width values. The operation of one of the proposed circuits was confirmed by a preliminary radiation experiment of alpha particles with a fabricated test chip.
机译:本文提出了两种电路来测量单事件瞬变(SET)的脉冲宽度分布。我们首先回顾加速中子辐射测试中SET测量的要求,并指出先前工作的问题,包括时间分辨率,获取大样本的时间/面积效率以及脉冲宽度绝对值的确定性。然后,我们设计出两个测量电路和一个脉冲发生器电路,这些电路可以满足所有要求并达到亚FO1反相器延迟分辨率,并提出一种测量程序以确保绝对宽度值。拟议的电路之一的操作已通过使用制造的测试芯片对α粒子进行的初步辐射实验得到了证实。

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