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Statistical static timing analysis flow for transistor level macros in a microprocessor

机译:微处理器中晶体管级宏的统计静态时序分析流程

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Process variations are of great concern in modern technologies. Early prediction of their effects on the circuit performance and parametric yield is extremely useful. In today's microprocessors, custom designed transistor level macros and memory array macros, like caches, occupy a significant fraction of the total core area. While block-based statistical static timing analysis (SSTA) techniques are fast and can be used for analyzing cell based designs, they cannot be used for transistor level macros. Currently, such macros are either abstracted with statistical timing models which are less accurate or are analyzed using statistical Monte-Carlo circuit simulations which are time consuming. In this paper, we develop a fast and accurate flow that can be used to perform SSTA on large transistor and memory array macros. The delay distributions of paths obtained using our flow for a large, industrial, 45 nm, transistor level macro have error of less than 6% compared to those obtained after rigorous Monte-Carlo SPICE simulations. The resulting flow enables full-chip SSTA, provides visibility into the macro even at the chip level, and eliminates the need to abstract the macros with statistical timing models.
机译:在现代技术中,工艺变化非常重要。对它们对电路性能和参数成品率的影响进行早期预测非常有用。在当今的微处理器中,定制设计的晶体管级宏和存储器阵列宏(如高速缓存)占据了整个核心区域的很大一部分。尽管基于块的统计静态时序分析(SSTA)技术快速且可用于分析基于单元的设计,但它们不能用于晶体管级宏。当前,这些宏要么使用精度较差的统计时序模型来抽象,要么使用费时的统计蒙特卡洛电路仿真来进行分析。在本文中,我们开发了一种快速而准确的流程,该流程可用于在大型晶体管和存储器阵列宏上执行SSTA。与经过严格的蒙特卡洛SPICE仿真后获得的路径相比,使用我们的流程获得的,大型的工业45 nm晶体管级宏的路径的延迟分布具有小于6%的误差。由此产生的流程使全芯片SSTA得以实现,甚至在芯片级也能提供对宏的可视性,并且无需使用统计时序模型来抽象宏。

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