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The equivalent diameter of copper wire and gold wire based on the sweep stiffness evaluation in semiconductor packaging

机译:基于半导体封装扫掠刚度评估的铜线和金线的等效直径

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As gold content accounts for the majority of bonding wire expense, wire diameter reduction is an effective way to reduce cost. However, it had been proved by authors' previous studies that the smaller the wire diameter is used, the smaller the sweep stiffness of wire bond will is. The lower sweep stiffness of the wire bond will always cause higher risk of wire sweep. To reduce cost, copper wire is an alterative way to replace gold wire. The advantages of using Cu instead of Au wire are the lower price, the higher electrical conductivity and the high resistance to wire sweep during plastic encapsulation, although, the oxidation problem of copper wire during bonding process needs to be overcome in the future. From the material property point of view, Cu is harder than Au, which represents the possible smaller diameter of wire can be used. Moreover, the introduction of Cu wire will lead to the further development of smaller pitch devices. In this paper, the corresponding diameters of gold wire and copper wire will be presented by the evaluation of sweep stiffness of wire bonds. Based on the results of sweep stiffness, the listed tables for the appropriate choice of gold wire diameter versus copper wire diameter can be proposed to reduce cost and, furthermore, provide smaller allowance standard of fine pitch in a chip.
机译:由于金含量占键合线成本的大部分,因此减小线径是降低成本的有效方法。但是,作者的先前研究已经证明,使用的导线直径越小,导线键合的扫掠刚度就越小。导线键合的较低扫掠刚度将始终导致较高的导线扫掠风险。为了降低成本,铜线是替代金线的替代方法。尽管将来需要克服铜线在键合过程中的氧化问题,但使用铜代替金线的优点是价格较低,电导率较高并且在塑料封装过程中具有较高的抗线扫性。从材料性能的角度来看,Cu比Au硬,这表示可以使用较小直径的导线。此外,铜线的引入将导致更小间距的器件的进一步发展。本文将通过评估引线键合的扫掠刚度来给出金线和铜线的相应直径。基于扫描刚度的结果,对金线直径与铜丝直径的适当选择所列出的表可被提出,以降低成本,此外,在一个芯片提供细间距的较小的津贴标准。

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