首页> 外文会议>Journal of Rare Earths vol.24 Spec. Issue March 2006 >Effects of Buffer Layer on Hetero-Epi-Growth of SiCGe on 6H-SiC
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Effects of Buffer Layer on Hetero-Epi-Growth of SiCGe on 6H-SiC

机译:缓冲层对6H-SiC SiCGe异质外延生长的影响

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Growth of SiCGe ternary alloy on 6H-SiC in a conventional hot-wall CVD system was initially studied. SiH_4, GeH_4 and C_3H_8 were employed as silicon, germanium and carbon source, respectively, while H_2 was employed as the carrier gas. To reduce the heavy lattice mismatch between the film and the substrate, a 3C-SiC buffer layer was inserted between them in a CVD process. Optimizing the growth conditions was discussed. The samples were measured by means of SEM, SAXRD (Small Angle X-Ray Diffraction).It is shown that use of the 3C-SiC buffer layer is an effective way to improve the quality of the ternary alloy.
机译:最初研究了在传统的热壁CVD系统中SiCGe三元合金在6H-SiC上的生长。 SiH_4,GeH_4和C_3H_8分别用作硅,锗和碳源,而H_2作为载气。为了减少薄膜和基板之间的重晶格失配,在CVD工艺中在它们之间插入了3C-SiC缓冲层。讨论了优化生长条件。通过SEM,SAXRD(小角X射线衍射)对样品进行了测量。结果表明,使用3C-SiC缓冲层是提高三元合金质量的有效方法。

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