A NEW REGISTRATION OF INTERFEROMETRIC SAR: LEAST-SQUARES REGISTRATION

摘要

Synthetic aperture radar interferometry is an imaging technique for measuring the topography of a surface, its changes over time, and other changes in the detailed characteristics of the surface. In order to get interference patterns, the images from two satellite passes must be registered to subpixel accuracy. In the paper, we discuss the registration of two interfering SAR images based on Least-Squares method. A novel measure is proposed to compute sum of phase difference of two SAR images, and minimized to find the optimal registration parameters. The accuracy of registration based Least-Squares method is 0.05 pixel to 0.07 pixel in our test.