Dynamical Properties of Vortices in the Mixed State of Amorphous Mo_xSi_(1-x) Films

摘要

The current-voltage (I-V) and current-induced voltage-noise S_v measurements have been performed for an amorphous Mo_xSi_(1-x) film in various fields B at constant temperature. Below the "glass-like" melting field B_gapprox0.5T determined from the I-V characteristics, we have observed 1/f~#beta# noise spectra with frequency (f) independent exponents #beta# (<1). For low fields (<0.06T), #beta# takes an almost constant value and S_v increases monotonically with increasing I. In contrast, for higher fields 0.06T