THOUGHTS ABOUT THE OPTIMUM DATA ACQUISITION GEOMETRYAND TIME RESOLUTION OF MONOCHROMATIC BEAM X-RAY DIFFRACTION MICROSCOPY EXPERIMENTS

摘要

So far, 3D X-ray diffraction microscopy (3DXRD) and X-ray diffraction contrast tomography (DCT) experiments have typically been performed in forward scattering geometry, the detector intercepting diffraction cones up to limited opening angles below 30°. The extension of the current synchrotron-based methodology towards 3D orientation mapping of deformed microstructures with down to (sub-)micrometer spatial resolution will require a reduction of the pixel and hence sample size by one order of magnitude. This in turn relaxes the need for high energy beams and opens interesting possibilities for new acquisition geometries, taking advantage of improved spatial resolution and strain sensitivity at high diffraction angles. First results obtained in this acquisition geometry will be discussed and a comparison to polychromatic micro-diffraction experiments is drawn.