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THE EFFECT OF PBGA SOLDER PAD GEOMETRY ON SOLDER JOINT RELIABILITY

机译:PBGA焊盘几何对焊点可靠性的影响

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In thermal cycling tests comparing the board-level reliability of SMD versus NSMD PBGA solder pads, packages incorporating the NSMD pads were observed to last much longer. No failures were detected through 15,000 0 to 100°C cycles on NSMD packages built onto NSMD test board pads. Four failures of NSMD packages on SMD test board pads detected up to 12,556 cycles appeared to be premature and may not be bulk solder fatigue related as no additional events have occurred on these configurations. These four failures will be investigated further.
机译:在热循环试验中,比较SMD与NSMD PBGA焊盘的板级可靠性,观察到结合NSMD焊盘的包装持续得多。在NSMD封装上,通过15,000 0到100°C循环,在NSMD测试板垫上,无需检测到故障。 SMD测试板焊盘上的NSMD封装的四次故障检测到12,556个循环似乎是早产,并且可能不是批量焊接疲劳相关,因为这些配置没有发生额外的事件。这四项失败将进一步调查。

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