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Thermal and carrier transport in laser photo-etching of n-GaAs semiconductor thin films

机译:N-GaAs半导体薄膜的激光光蚀刻中的热和载波传输

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Coupled thermal and carrier transport (electron/hole generation, recombination, diffusion and drifting) in laser photo-etching of GaAs thin film is investigated. A new volumetric heating mechanism originated from SRH (Shockley-Read-Hall)non-radiative recombination and photon recycling is proposed and modeled based on recent experimental findings. Both volumetric SRH heating and Joule heating are found to be important in the carrier transport as well as the etching process. SRH heatingand Joule heating are primarily confined within the space charge region which is about 20 nm from the GaAs surface. Surface temperature rises rapidly as the laser intensity exceeds 10{sup}5 (W/m{sup}2). Below a laser intensity of 10{sup}5 (W/m{sup}2),thermal effect is negligible. The etch rate is found to depend on the competition between photo-voltaic and photo-thermal effects on surface potential. At high laser intensity, etch rate is increased by more than 100% due to the SRH and Joule heating.
机译:研究了GaAs薄膜的激光光蚀刻中的耦合热和载波(电子/孔,重组,扩散,扩散和漂移)。提出了一种来自SRH(Shockley-Read-Hall)非辐射重组和光子再循环的新的体积加热机制,并基于最近的实验结果进行建模。发现体积SRH加热和焦耳加热在载体运输以及蚀刻过程中是重要的。 SRH加热焦耳加热主要限制在空间电荷区域内,该空间电荷区域是从GaAs表面约20nm的。表面温度随着激光强度超过10 {SUP} 5(W / M {SUP} 2)而迅速上升。低于10 {sup} 5(w / m {sup} 2)的激光强度,热效果可忽略不计。发现蚀刻速率取决于光伏和光热效应对表面电位之间的竞争。由于SRH和焦耳加热,在高激光强度下,蚀刻速率增加超过100%。

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