We present a power electronics packaging technology utilizing chip-scale packaged (CSP) power devices to build three-dimensional integrated power electronics modules (IPEMs). The chip-scale packaging structure, termed Die Dimensional Ball Grid Array (D~2BGA), eliminates wire bonds by using stacked solder bumps to interconnect power chips. D~2BGA package consists of a power chip, inner solder bumps, high-lead solder balls, and molding resin. It has the same lateral dimensions as the starting power chip, which makes high-density packaging and module miniature possible. This package enables the power chip tocombine excellent thermal transfer, high current handling capability, improved electrical characteristics, and ultra-low profile packaging. Electrical tests show that the V_(CE) (sat) and on-resistance of the D~2BGA high speed insulated-gate-bipolar transistors (IGBTs) are improved by 20percent and 30prcent respectively by eliminating the device's wirebonds and other external interconnections, such as the leadframe. In this paper, we present the design, reliability, and processing issues of D~2BGA package, and the implementation of these chip-scale packaged power devices in building 30k W half-bridge power converter modules. The electrical and reliability test results of the packaged devices and the power modules are reported.
展开▼
