We examine the applicability of the ptychographical reconstruction method to the imaging of zinc-blende semiconductor compounds. We demonstrate that the reconstruction does not match the exit surface wave function, but instead resembles the wave function with a fixed focus setting on the middle section of the specimen. We describe a method to determine the polarity of semiconductor nanocrystals. The technique relies on the measurement of the relative phase between diffraction discs of a systematic row, and is shown to be particularly robust against scattering from the amorphous support.
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