Controlled environment high resolution electron microscopy as a means of understanding fullerene generation

摘要

A modified JEOL 4000EX High Resolution Electron Microscope, fitted with a Gas Reaction Cell, has been used to immerse graphite flakes in a 25 mbar helium atmosphere. Under the influence of the electron-beam, and at a variety of specimen temperatures, rapid morphological and microstructural changes have been investigated. This has led to what we believe are the first direct and real-time observations of the formation of fullerene shells from previously untreated graphite.