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High Speed Low Gate Leakage Large Capacitive-Load Driver Circuits for Low-Voltage CMOS

机译:用于低压CMOS的高速低栅极泄漏大电容负载驱动器电路

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In this work, a high-speed full swing driver for large capacitive-loads for low-voltage CMOS applications is presented. The driver which has multi-path for driving the load has a low gate leakage. It works similar to a standard CMOS gate and can be implemented in any CMOS fabrication technology. The circuit does not use extra bootstrap capacitors, has a small effective input capacitance, and can operate in a wide range of supply voltages. Analytical expressions for the sizing of the transistors which should be determined for any load capacitance are also presented. The driver is compared to the previously proposed circuits in a 65 nm CMOS technology using HSPICE simulations. The results show that the circuit operates 20% faster than the previous drivers and its gate leakage is about half of the gate leakage of bootstrap drivers.
机译:在这项工作中,提出了一种适用于低压CMOS应用的大容性负载的高速全摆幅驱动器。具有多路驱动负载的驱动器的栅极泄漏较低。它的工作方式类似于标准的CMOS门,可以在任何CMOS制造技术中实现。该电路无需使用额外的自举电容器,有效输入电容很小,并且可以在很宽的电源电压范围内工作。还提供了针对晶体管的尺寸的解析表达式,应针对任何负载电容确定该解析表达式。使用HSPICE仿真将该驱动器与先前提出的采用65 nm CMOS技术的电路进行了比较。结果表明,该电路的运行速度比以前的驱动器快20%,其栅极泄漏约为自举驱动器栅极泄漏的一半。

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