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Low on-resistance SOI power MOSFET using dynamic threshold (DT) concept for high efficient DC-DC converter

机译:采用动态阈值(DT)概念的低导通电阻SOI功率MOSFET用于高效DC-DC转换器

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摘要

A new low on-resistance (R/sub on/) power MOSFET using the dynamic threshold (DT) concept was studied. The R/sub on/ at low gate-driving-voltage was effectively improved using the DT concept. We carried out numerical simulations based on the experimental measurements. It was clarified that the R/sub on/ of the thin-film DT-SOI power MOSFET was 30% lower than that of conventional thin-film SOI power MOSFETs at a gate voltage of 1.2 V. Although the R/sub on/ of the DT-SOI device was lower, the total gate charge was slightly larger than that of conventional devices because of an additional device structure. The lower R/sub on/ reduces the power loss of a synchronous rectifier while the larger gate charge increases it. We compared the power loss of the thin-film DT-DOI device as the synchronous rectifier of a DC-DC converter with that of a conventional thin-film SOI device. It was clarified that the power loss of the new power MOSFET was 36% lower than that of the conventional thin-film SOI device at a gate voltage of 1.2 V.
机译:研究了一种采用动态阈值(DT)概念的新型低导通电阻(R / sub on /)功率MOSFET。使用DT概念有效地改善了低栅极驱动电压下的R / sub导通/。我们基于实验测量值进行了数值模拟。可以确定的是,在DT栅极电压为1.2 V的情况下,薄膜DT-SOI功率MOSFET的R / sub on /比常规薄膜SOI功率MOSFET的R / sub on /低30%。 DT-SOI器件较低,总栅极电荷比常规器件要大一些,这是因为它具有附加的器件结构。较低的R / sub on /降低了同步整流器的功率损耗,而较大的栅极电荷则增加了它的功率。我们将作为直流-直流转换器同步整流器的薄膜DT-DOI器件的功率损耗与传统的薄膜SOI器件的功率损耗进行了比较。可以确定,在栅极电压为1.2 V时,新型功率MOSFET的功率损耗比传统的薄膜SOI器件低36%。

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