首页> 外文会议>2006 11th International Symposium on Advanced Packaging Materials: Processes, Properties and Interface >Low on-resistance SOI power MOSFET using dynamic threshold (DT)concept for high efficient DC-DC converter
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Low on-resistance SOI power MOSFET using dynamic threshold (DT)concept for high efficient DC-DC converter

机译:使用动态阈值(DT)的低导通电阻SOI功率MOSFET高效DC-DC转换器的概念

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A new low on-resistance (Ron) power MOSFET using thedynamic threshold (DT) concept was studied. The Ron at lowgate-driving-voltage was effectively improved using the DT concept. Wecarried out numerical simulations based on the experimentalmeasurements. It was clarified that the Ron of the thin-filmDT-SOI power MOSFET was 30% lower than that of conventional thin-filmSOI power MOSFETs at a gate voltage of 1.2 V. Although theRon of the DT-SOI device was lower, the total gate charge wasslightly larger than that of conventional devices because of anadditional device structure. The lower Ron reduces the powerloss of a synchronous rectifier while the larger gate charge increasesit. We compared the power loss of the thin-film DT-DOI device as thesynchronous rectifier of a DC-DC converter with that of a conventionalthin-film SOI device. It was clarified that the power loss of the newpower MOSFET was 36% lower than that of the conventional thin-film SOIdevice at a gate voltage of 1.2 V
机译:一种新型的低导通电阻(R on )功率MOSFET使用 研究了动态阈值(DT)概念。 R on 低 DT概念有效地改善了栅极驱动电压。我们 根据实验进行了数值模拟 测量。澄清了薄膜的R on DT-SOI功率MOSFET比传统薄膜低30% SOI功率MOSFET的栅极电压为1.2V。 DT-SOI设备的R 较低,总栅极电荷为 比传统设备稍大一点,因为 附加的设备结构。较低的R on 会降低功率 同步整流器的损耗,而较大的栅极电荷增加 它。我们将薄膜DT-DOI器件的功率损耗与 DC-DC转换器的同步整流器与传统的同步整流器 薄膜SOI器件。澄清了新的功率损耗 功率MOSFET比常规薄膜SOI低36% 栅极电压为1.2 V的器件

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