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Models of charge transport in electron-beam irradiated insulators

机译:电子束辐照绝缘子中的电荷传输模型

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Carrier generation in an insulator due to electron-beam irradiation causes a radiation-induced conductivity. This phenomenon can be considered in the equations for charge transport in two different ways: A first, macroscopic, approach takes into account only the radiation-induced conductivity while a second, microscopic, scheme is based on a detailed description of the carrier generation and recombination in the insulator including the carrier mobility. As compared to the macroscopic approach, the microscopic procedure requires a larger and more complicated system of equations and the knowledge of the generation and recombination rates. Therefore, numerical evaluations on the basis of the macroscopic model are often more desirable. In this case, only the knowledge of the radiation-induced conductivity, which is easily measurable, is necessary. Numerical results for open-circuit conditions, obtained from both models, are compared and advantages and drawbacks of the two models discussed.
机译:由于电子束辐照而在绝缘子中产生载流子会引起辐射感应的电导率。可以在电荷传输的方程式中以两种不同的方式考虑这种现象:第一种宏观方法仅考虑辐射诱导的电导率,而第二种微观方案基于载流子生成和复合的详细描述在绝缘体中包括载流子迁移率。与宏观方法相比,微观过程需要更大,更复杂的方程组系统以及生成和重组速率的知识。因此,通常更需要基于宏观模型的数值评估。在这种情况下,仅需要易于测量的辐射感应电导率的知识即可。比较了从两个模型获得的开路条件的数值结果,并讨论了两个模型的优缺点。

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