A modified and calibrated drift-diffusion-reaction model for time-domain analysis of charging phenomena in electron-beam irradiated insulators

摘要

This paper presents a modified self-consistent drift-diffusion-reaction model suitable for the analysis of electron-beam irradiated insulators at both short and long time scales. A novel boundary condition is employed that takes into account the reverse electron current and a fully dynamic trap-assisted generation-recombination mechanism is implemented. Sensitivity of the model with respect to material parameters is investigated and a calibration procedure is developed that reproduces experimental yield-energy curves for uncharged insulators. Long-time charging and yield variations are analyzed for stationary defocused and focused beams as well as moving beams dynamically scanning composite insulators.