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A new PZT thin film preparation technique using solid oxygen-source target by RF reactive sputtering

机译:射频反应溅射利用固态氧源靶制备PZT薄膜的新技术

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A new target for RF reactive sputter deposition technique was adopted to deposit lead zirconate titanate (Pb(Zr,Ti)O/sub 3/) thin films using a metal-oxide composite (ZrTi+30%PbO/sub n/ (n=l,2)) targets. PZT films were deposited on Pt/Ti/SiO/sub 2//Si substrate with temperature varied from 200 to 550/spl deg/C, O/sub 2/-Ar mixture gas was used for the sputtering with changing the mixing ratio from 0% to 6.3%. In this study it is confirmed that PbO/sub 2/ supplied more oxygen than PbO by the gas analyzer. Moreover perovskite PZT peak was observed in XRD measurement for film grown with PbO/sub 2/ target without introducing any oxygen gas during the deposition, whereas no peak was observed for PbO target under the same conditions.
机译:射频反应溅射沉积技术的新目标是采用金属氧化物复合材料(ZrTi + 30%PbO / sub n /(n = l,2))目标。将PZT膜沉积在温度从200到550 / spl deg / C的Pt / Ti / SiO / sub 2 // Si衬底上,使用O / sub 2 / -Ar混合气体进行溅射,改变混合比0%至6.3%。在这项研究中,通过气体分析仪证实了PbO / sub 2 /提供的氧气比PbO多。此外,在XRD测量中,在沉积过程中未引入氧气的情况下,用PbO / sub 2 /靶生长的膜观察到钙钛矿PZT峰,而在相同条件下未观察到PbO靶的峰。

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