Summary form only given. We have proposed deflection by an optical near field on a fiber probe to control atoms with high spatial accuracy. In this case, the deflection angle is estimated to be 0.1 degree for a Rb atom with an incident velocity of 10 m/s. It leads to the deviation of 10 /spl mu/m from the incident axis at 1 cm. in the downstream. To detect the deflected atoms with an accuracy of 1%, we need the spatial resolution of 100 nm. However, a commercial detector such as MCP has a low resolution of 50 /spl mu/m at most and the highest resolution that has been reported is 1 /spl mu/m to our knowledge. In addition, these are applied to metastable atoms and have less detection efficiency for the ground state atoms we manipulate. For drastic improvement, we present here a slit-type atom detector with a nanometric lateral resolution. Since the number of atoms deflected by the optical near field is very small, it is important to detect atoms with high efficiency. For this purpose, we use photoionization with two-color optical near fields.
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机译：仅提供摘要表格。我们提出了在光纤探针上通过光学近场偏转来控制具有高空间精度的原子。在这种情况下，对于入射速度为10 m / s的Rb原子，偏转角估计为0.1度。这导致距入射轴1 cm处10 / spl mu / m的偏差。在下游。为了以1％的精度检测偏转的原子，我们需要100 nm的空间分辨率。然而，诸如MCP之类的商用检测器具有至多50 / spl mu / m的低分辨率，并且据我们所知，已报道的最高分辨率为1 / spl mu / m。此外，它们被应用于亚稳态原子，并且对于我们操纵的基态原子具有较低的检测效率。为了大幅度改善，我们在此介绍一种具有纳米横向分辨率的狭缝型原子检测器。由于光学近场偏转的原子数量非常小，因此高效检测原子很重要。为此，我们使用具有两色光学近场的光电离。
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