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One-hot residue coding for high-speed non-uniform pseudo-random test pattern generation

机译:一热残差编码,用于高速非均匀伪随机测试图生成

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VLSI implementations of fast residue number system arithmetic units for one-hot encoded operands are presented. They are shown to allow generalized LFSRs (i.e., those with any modulus) to be implemented with faster clock speeds and simpler, more regular layouts. Their high speed is exemplified by the design of a non-uniform pseudo-random test pattern generator for performance testing of an ATM packet switch. Timing estimates of the generator indicate as much as a 50% increase in clock speed as compared with a standard design. The speed increase is made possible because the one-hot encoding eliminates the address decoding circuitry in the inverse probability distribution RAM.
机译:提出了用于一热编码操作数的快速残数系统算术单元的VLSI实现。它们显示出可以以更快的时钟速度和更简单,更规则的布局来实现通用LFSR(即具有任意模数的LFSR)。它们的高速度由用于ATM数据包交换机性能测试的非均匀伪随机测试码型发生器的设计来举例说明。与标准设计相比,发生器的时序估计表明时钟速度提高了多达50%。由于单次热编码消除了逆概率分布RAM中的地址解码电路,因此可以提高速度。

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