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Carrier lifetime and linewidth enhancement factor measurements from cross-modulation characteristics in semiconductor optical amplifiers

机译：通过半导体光放大器的交叉调制特性测量载波寿命和线宽增强因子

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来源
《》|1990年|P.130-131|共2页
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Kikuchi; K.; Itatani; T.;
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中图分类无线电电子学、电信技术;
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专利

1. Measurement of carrier lifetime and linewidth enhancement factor for 1.5- mu m ridge-waveguide laser amplifier [J] . Storkfelt N., Mikkelsen B. IEEE Photonics Technology Letters . 1991,第7期

机译：1.5微米脊形波导激光放大器的载流子寿命和线宽增强因子的测量
2. Measurement of the linewidth enhancement factor based on nonlinear polarization rotation of semiconductor optical amplifier [J] . Liu Guodong, Wu Chongqing, Wang Fu, Applied optics . 2015,第16期

机译：基于半导体光放大器的非线性偏振旋转的线宽增强因子的测量
3. Measurement of the stimulated carrier lifetime in semiconductor optical amplifiers by four-wave mixing of polarized ASE noise [J] . Hunziker G., Paiella R. IEEE Photonics Technology Letters . 1997,第7期

机译：通过极化ASE噪声的四波混频测量半导体光放大器中受激载波的寿命
4. Carrier lifetime and linewidth enhancement factor measurements from cross-modulation characteristics in semiconductor optical amplifiers [C] . Kikuchi K., Itatani T., Institute of Electric and Electronic Engineer IEEE International Semiconductor Laser Conference . 1990

机译：载流子寿命和线宽增强因子从半导体光放大器中的交叉调制特性测量
5. Time-resolved measurements of charge carrier dynamics and optical nonlinearities in narrow-bandgap semiconductors. [D] . Olson, Benjamin Varberg. 2013

机译：窄带隙半导体中载流子动力学和光学非线性的时间分辨测量。
6. Thermally insensitive determination of the linewidth broadening factor in nanostructured semiconductor lasers using optical injection locking [O] . Cheng Wang, Kevin Schires, Marek Osiński, -1

机译：使用光注入锁定对纳米结构半导体激光器的线宽展宽因子进行热敏测定
7. Measurement of carrier lifetime and linewidth enhancement factor for 1.5- mu m ridge-waveguide laser amplifier [O] . Storkfelt Niels, Mikkelsen B., Olesen D. S., 1991

机译：测量1.5微米脊波导激光放大器的载流子寿命和线宽增强因子

Carrier lifetime and linewidth enhancement factor measurements from cross-modulation characteristics in semiconductor optical amplifiers

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