首页> 外文会议> >A comparative study of functional 16 K bipolar PROM circuits fabricated on bonded, oxide isolated and junction isolated substrates
【24h】

A comparative study of functional 16 K bipolar PROM circuits fabricated on bonded, oxide isolated and junction isolated substrates

机译:在键合,氧化物隔离和结隔离衬底上制造的功能性16 K双极PROM电路的比较研究

获取原文

摘要

Summary form only given. Fully functional 16 K bipolar PROMS fabricated on bonded, oxide-isolated and junction-isolated substrates are discussed. The differences in device parameters, particularly those related to leakage current, are related to the unique properties of each substrate type. Circuit performance improvements were attained by the reduction of the collector-to-substrate capacitance of the bipolar transistors.
机译:仅提供摘要表格。讨论了在键合,氧化物隔离和结隔离的基板上制造的全功能16 K双极PROMS。器件参数的差异,特别是与漏电流有关的参数,与每种衬底类型的独特特性有关。通过减小双极晶体管的集电极到衬底的电容,可以提高电路性能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号