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Influence of band-gap localized states on metal-amorphous hydrogenated silicon contact parameters

机译:带隙局部化态对金属-非晶态氢化硅接触参数的影响

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Abstract: Amorphous hydrogenated silicon (a-Si:H) is a very interesting and perspective semiconductor applied in solar cells, optical image sources, memory cells, etc. But the problem of metal-amorphous hydrogenated silicon contact is not solved at present. It has been noted that application of the crystalline barrier theory is not correct in this case. This is connected with the high density of states in the midgap, which is not observed in crystalline silicon. Evidently the high density of states influences to a large extent the metal/a- Si:H barrier parameters and its formation mechanism. In this paper, some theoretical calculations of voltaic dependence of the barrier low-frequency capacitance are presented with the results of barrier height measurement. !4
机译:摘要:非晶态氢化硅(a-Si:H)是一种非常有趣且具有前景的半导体,应用于太阳能电池,光学图像源,存储单元等。但是,金属非晶态氢化硅的接触问题目前尚未解决。已经注意到,在这种情况下,晶体阻挡层理论的应用是不正确的。这与中间隙中的高密度状态有关,而在晶体硅中则没有观察到。显然,高密度状态在很大程度上影响金属/ a-Si:H势垒参数及其形成机理。本文给出了势垒低频电容的伏安依赖性的一些理论计算,并给出了势垒高度的测量结果。 !4

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