首页> 外文会议>International Conference on Silicon Carbide and Related Materials 2001 Pt.2 Oct 28-Nov 2, 2001 Tsukuba, Japan >Photoreflectance Characterization of GaNAs/GaAs Multiple Quantum Well Structures
【24h】

Photoreflectance Characterization of GaNAs/GaAs Multiple Quantum Well Structures

机译:GaNAs / GaAs多量子阱结构的光反射特性

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

We investigate GaNAs/GaAs multiple quantum well structures using the photoreflectance spectroscopy at various temperatures. The modulated optical response consists of quantum well excitonic transitions and band edge transitions that exhibits Franz-Keldysh oscillatory features. The bowing parameter, effective mass, and the band-offset value were adjusted to obtain the subband energies to best fit the observed quantum well transition energies. The period of the Franz-Keldysh oscillations indicates the strength of the internal field.
机译:我们在不同温度下使用光反射光谱法研究GaNAs / GaAs多量子阱结构。调制后的光学响应由量子阱激子跃迁和能带展现Franz-Keldysh振荡特征的能带边缘跃迁组成。调整弯曲参数,有效质量和带隙值以获得子带能量,以最佳地拟合所观察到的量子阱跃迁能量。 Franz-Keldysh振荡的周期表明内部磁场的强度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号