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The Neutral Silicon Vacancy in SiC: Ligand Hyperfine Interaction

机译:SiC中的中性硅空位:配体超精细相互作用

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摘要

The isolated silicon vacancy in its neutral charge state has unambiguously been confirmed in electron irradiated 4H and 6H SiC. This was achieved by the observation of the ligand hyperfine lines arising from interaction with ~(13)C atoms in the nearest-neighbor (NN) shell and with ~(29)Si atoms in the next-nearest-neighbor (NNN) shell in optically detected magnetic resonance (ODMR) experiments. The complete hyperfine tensors for all inequivalent lattice sites have been deduced and are compared to the known hyperfine parameters for the negatively charged silicon vacancy in the two polytypes.
机译:在电子辐照的4H和6H SiC中已明确确认了处于中性电荷状态的孤立硅空位。这是通过观察配体超细线而实现的,该配体超细线是由与最近邻(NN)壳中的〜(13)C原子以及与下一近邻(NNN)壳中的〜(29)Si原子相互作用而产生的。光学检测磁共振(ODMR)实验。推导了所有不等价晶格位点的完整超精细张量,并将其与两种多型中带负电的硅空位的已知超精细参数进行了比较。

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