SEM Image Analysis for Roughness Assessment of Implant Materials

摘要

We propose a new very simple method to determine roughness of a surface of an implant material from its scanning electron microscopy (SEM) image. For this purpose we have combined a preprocessing method that has been used in histopathology with fractal method used in nonlinear time series analysis. In the pre-processing step the image is transformed into 1-D signals ('landscapes') that are subsequently analyzed. Our method draws from multiple disciplines and may find multidisciplinary applications.