首页> 外国专利> ASSESSMENT METHOD Systematic errors in methodology for measuring morphological characteristics of the material structure in the condensed state PHONE, COMPUTER SYSTEM IMPLEMENTED BY IMAGE ANALYSIS AND STANDARD MODEL FOR THE IMPLEMENTATION OF THE METHOD

ASSESSMENT METHOD Systematic errors in methodology for measuring morphological characteristics of the material structure in the condensed state PHONE, COMPUTER SYSTEM IMPLEMENTED BY IMAGE ANALYSIS AND STANDARD MODEL FOR THE IMPLEMENTATION OF THE METHOD

机译:评估方法在凝聚态电话中测量材料结构形态特征的方法学中的系统误差,由图像分析实现的计算机系统以及实现该方法的标准模型

摘要

1. A method of estimating and controlling the systematic error of measurement of morphological characteristics of the material structure body techniques in the condensed state realized by a computer image analysis system, comprising: obtaining a standard image of the sample surface, processing of the image in order to isolate it measurement objects measurements and comparing the result obtained with a reference value, while in the sample used as standard surface structure imitations mater iala drawing which received digital image processing of a representative portion of the material prepared in accordance metodikoy.2 evaluated. Standard sample for evaluation and control of the systematic error of measurement of the material structure morphological characteristics techniques bodies in the condensed state realized by a computer image analysis system comprising a surface on which the retaining scale formed pattern simulation material pattern which is obtained digital image processing of a representative portion of the material, prepared according metodikoy.3 evaluated. The standard sample according to claim 2, characterized in that the simulation material structure formed on the surface of the standard sample in natural velichinu.4. The standard sample according to claim 2, characterized in that the imitation of the structure of the material formed on the surface of the sample by standard thin film technology, providing resolution that allows to form structural elements simulating, suitable
机译:1。一种估计和控制通过计算机图像分析系统实现的在浓缩状态下材料结构体技术的形态特征的测量系统误差的方法,该方法包括:获得样品表面的标准图像,对样品表面进行处理。为了隔离测量对象的测量结果,并将获得的结果与参考值进行比较,同时在用作标准表面结构仿制品的样品中进行了Iala绘图,该绘图接受了根据metodikoy.2制备的材料的代表性部分的数字图像处理。通过计算机图像分析系统实现的用于压缩状态下材料结构形态特征技术主体的测量系统误差的评估和控制的标准样品,该计算机图像分析系统包括在其表面上形成有刻度的图案模拟材料图案的表面,该图案获得了数字图像处理根据metodikoy.3评估制备的材料的代表性部分。 3.根据权利要求2所述的标准样品,其特征在于,所述模拟材料结构以天然velichinu.4形式形成在所述标准样品的表面上。 3.根据权利要求2所述的标准样品,其特征在于,通过标准薄膜技术模仿在所述样品的表面上形成的材料的结构,提供允许形成模拟的结构元素的分辨率。

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