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Electroluminescence from ZnO~+-Si Heterojunction

机译:ZnO / n〜+ -Si异质结的电致发光

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摘要

The ZnO~+-Si heterojunction has been fabricated via depositing nominally undoped ZnO film by reactive sputtering on a heavily arsenic-doped (n~+) silicon substrate. The sputtered ZnO film was n-type in conductivity with an electron concentration of 1.0 × 10~(18) cm~(-3). The current-voltage characteristics indicate that the ZnO~+-Si heterojunction does not possess rectifying function. Under the forward bias with the negative voltage applied on the n~+-Si substrate, the heterojunction emits ultraviolet and broad visible lights characteristics of near-band-edge and defect-related emissions of ZnO, respectively. The EL mechanism has been tentatively explained in terms of the energy-band diagram.
机译:ZnO / n〜+ -Si异质结是通过在高砷掺杂(n〜+)硅衬底上通过反应溅射沉积名义上未掺杂的ZnO薄膜而制成的。溅射的ZnO薄膜的电导率为n型,电子浓度为1.0×10〜(18)cm〜(-3)。电流-电压特性表明ZnO / n〜+ -Si异质结不具有整流功能。在正向偏压下,在n〜+ -Si基板上施加负电压后,异质结分别发出紫外光和宽可见光的ZnO的近带边和缺陷相关发射特性。已经根据能带图尝试地解释了EL机制。

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