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Enhancement of Driving Capability of Gate Driver Using GaN HEMTs for High-Speed Hard Switching of SiC Power MOSFETs

机译:使用GaN HEMT增强SiC功率MOSFET的高速硬开关的栅极驱动器的驱动能力

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A high-speed gate driver based on GaN-HEMTs push-pull configuration has been proposed to drive a SiC power MOSFET at high switching frequency. In this study, we investigate the influences of parasitic inductances of the GaN HEMTs on the output voltage of the GaN-based gate driver. The parasitic inductances at the gate, source, and drain terminals of the GaN HEMTs are analyzed with SPICE simulation. It is found that the parasitic inductances at the gate and source terminals of the GaN HEMT have almost no influences on the output waveform of the gate driver, while the parasitic inductances at the drain terminal of the GaN HEMT produce large voltage oscillations of the output voltage.
机译:提出了一种基于GaN-HEMT推挽式配置的高速栅极驱动器,以高开关频率驱动SiC功率MOSFET。在这项研究中,我们研究了GaN HEMT的寄生电感对GaN基栅极驱动器输出电压的影响。使用SPICE仿真分析了GaN HEMT的栅极,源极和漏极端子处的寄生电感。发现GaN HEMT的栅极和源极端子上的寄生电感几乎不会影响栅极驱动器的输出波形,而GaN HEMT的漏极端子上的寄生电感会产生较大的输出电压振荡。

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