X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials

机译：硼化合物的X射线微分析：测量低Z材料的方法

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来源
《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》|2011年|592-593|共2页
会议地点 Nashville, TN(US)
作者
D. C. Meier; J. M. Davis; A. R. Konicek; E. P. Vicenzi; S. A. Wight;
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Surface and Microanalysis Science Division Material Measurement Laboratory National Instituteof Standards and Technology Gaithersburg MD 20899-8371;

Surface and Microanalysis Science Division Material Measurement Laboratory National Instituteof Standards and Technology Gaithersburg MD 20899-8371 Museum Conservation Institute Smithsonian Institution Suitland MD 20746;

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X-Ray Microanalysis of Boron Compounds: Approaches to Measuring Low-Z Materials

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