Optical characterization of anisotropic thin films ofperfluorinated copper phthalocyanine

摘要

We report Raman and ellipsometric measurements on F16CuPc (copperhexadecafluoro-phthalocyanine) thin films grown by organic molecular beam epitaxy onstepped A-plane sapphire substrates. These measurements reveal strong in-plane anisotropiesin the optical properties of the films, resulting from the spontaneous ordering of the crystallineorganic layers. Combining the results of both types of spectroscopy, we can obtain quantitativeinformation about the degree of order and the molecular stacking in the films.