Electrical and Optical Properties of Zinc doped Titanium dioxide Thin Films

摘要

The structural property of the prepared thin films was characterized by X-ray diffraction (XRD) method. The results of XRD data showed that the structure of the as-deposited thin films was amorphous phase. The surface morphology and composition of the thin films were investigated by scanning electron microscope (SEM) and energy dispersive X-ray Spectroscopy (EDS), respectively. The electrical property, in particular, electrical resistivity was observed by four-point probe method as a function of temperature. It is depicted that the resistivity decreased with increasing temperature and exhibited semiconducting nature of the sample. The optical transmittance was measured by the UV-visible spectrometer. The transmittance for the pure TiO