首页> 外文会议>IMAPS 2008 - 41st international symposium on microelectronics: bringing together the entire microelectronics supply chain >Prototyping a SiC JFET Drop-in Replacement Module for a 600-V, 600-A Si IGBT Half-Bridge Module
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Prototyping a SiC JFET Drop-in Replacement Module for a 600-V, 600-A Si IGBT Half-Bridge Module

机译:用于600V,600A Si IGBT半桥模块的SiC JFET嵌入式替换模块的原型

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Silicon carbide power vertical-channel junction field effect transistors (VJFETs) are ideal candidates for next generation vehicle power systems. They combine the switching speed of MOSFETs with the voltage and current handling properties of IGBTs and the excellent thermal properties derived from the SiC material. As a unipolar device they can be easily paralleled over the entire operating range of the device and generate extremely high current for high power application. With the drop-in replacement, the case temperature of the motor drive can be significantly increased above the current limit of 80 ℃, which will permit the designer new opportunities for decreasing size, weight, and cost.rnWith current die area yields, the only way to fabricate high-current IPMs that can address 600-A IGBT replacement is to parallel SiC die. A process for packaging a 600-V, 600-A IGBT replacement module based on very low specific on-resistance SiC VJFETs (2.5 mΩcm~2 ) co-packed with SiC Schottky Barrier Diodes (SBD) is reported. The design covering thermal design, material selection, and thermal (soldering) budget for the DBC and copper base plate commercial packaging is presented. The DBC design will be presented, which took into consideration accommodating 80 VJFETs in parallel and 40 SBDs in anti-parallel. All DBC were screened for single die failures using a multi-step process including high-temperature reverse bias screening. Finite element thermal analysis was utilized for appropriate packaging material selection. Successful completion of the packaging process was confirmed by DC and switching characterization.
机译:碳化硅功率垂直沟道结型场效应晶体管(VJFET)是下一代汽车电源系统的理想选择。它们将MOSFET的开关速度与IGBT的电压和电流处理性能以及源自SiC材料的出色热性能结合在一起。作为单极器件,它们可以很容易地在器件的整个工作范围内并联,并为高功率应用产生极高的电流。通过直接替换,可以将电动机驱动器的外壳温度显着提高到当前的80℃极限以上,这将为设计人员提供减小尺寸,重量和成本的新机会。能够解决600-A IGBT替换问题的大电流IPM的制造方法是并联SiC芯片。报告了一种基于与SiC肖特基势垒二极管(SBD)共装的极低导通电阻的SiC VJFET(2.5mΩcm〜2)的600 V,600 A IGBT替换模块的封装过程。提出了涵盖DBC和铜基板商业包装的热设计,材料选择和热(焊接)预算的设计。将介绍DBC设计,该设计考虑了可容纳80个并联VJFET和40个反并联SBD的设计。使用包括高温反向偏压筛选在内的多步骤过程,对所有DBC进行了单模故障筛选。有限元热分析用于适当的包装材料选择。 DC和开关特性证实了包装过程的成功完成。

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