首页> 外文会议>IEEE Pulsed Power Plasma Science >Low Energy Electron Irradiation Induced Charging of Dielectric Materials: Measurements and Analyses
【24h】

Low Energy Electron Irradiation Induced Charging of Dielectric Materials: Measurements and Analyses

机译:低能电子辐照介电材料的充电:测量和分析

获取原文
获取外文期刊封面目录资料

摘要

Charging of dielectric materials under electron irradiation is a commonly encountered problem in many space applications. Spacecraft charging due to solar and cosmic radiations may lead to critical discharge phenomenon. Indeed, under irradiation (especially electron irradiation), insulators as well as floating conductors may charge negatively or positively depending on the incident electron properties (energy, incidence angle, flux) and on the specific material properties (composition, surface roughness, contamination, temperature, etc.) The knowledge of the electrical properties electron emission yield, conductivity and radiation induced conductivity) under electron, irradiation for each material of the spacecraft is needed for spacecraft plasma interaction software. The energy distribution of the emitted secondary and backscattered electrons was measured dynamically with the help of high-speed hemispherical electron energy analyzer. The evolution of the surface potential of the irradiated sample can be derived from the energy shift of the secondary electron pic. The method is applied to 25-µm Kapton.
机译:在许多空间应用中,电子辐照下介电材料的充电是一个普遍遇到的问题。太阳和宇宙辐射给航天器充电可能会导致严重的放电现象。实际上,在辐射(尤其是电子辐射)下,绝缘体以及浮动导体可能会带负电或带正电,具体取决于入射电子特性(能量,入射角,通量)和特定的材料特性(成分,表面粗糙度,污染,温度)等)航天器等离子体相互作用软件需要了解航天器每种材料在电子,辐照下的电学性质,电子发射率,电导率和辐射感应电导率。借助高速半球形电子能量分析仪动态地测量了发射的二次电子和反向散射电子的能量分布。被辐照样品的表面电势的演变可以从二次电子pic的能量位移中得出。该方法适用于25 µm的Kapton。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号