首页> 外文会议>IEEE International Conference on Signal and Image Processing >On comparing color spaces for fabric defect classification based on local binary patterns
【24h】

On comparing color spaces for fabric defect classification based on local binary patterns

机译:基于局部二进制模式的织物缺陷分类颜色空间比较

获取原文

摘要

There is a numerous color spaces with different properties in literature. In order to find the appropriate and relevant color space for the fabric defect classification problem, we propose to investigate the performance and robustness of the Local Binary Pattern (LBP) descriptor in supervised context by using SVM classifier. The experimental results show that the luminance-chrominance spaces are suitable for coding fabric defect with the classification accuracy obtained is 92.1%.
机译:在文献中有许多具有不同性质的色彩空间。为了找到适合织物缺陷分类问题的合适颜色空间,我们建议使用SVM分类器研究在监督环境下局部二进制模式(LBP)描述符的性能和鲁棒性。实验结果表明,亮度色度空间适合于编码织物疵点,分类精度为92.1%。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号