This paper presents a fast and efficient method for classifying X-ray images using random forests with proposed local wavelet-based local binary pattern (LBP) to improve image classification performance and reduce training and testing time. Most studies on local binary patterns and its modifications, including centre symmetric LBP (CS-LBP), focus on using image pixels as descriptors. To classify X-ray images, we first extract local wavelet-based CS-LBP (WCS-LBP) descriptors from local parts of the images to describe the wavelet-based texture characteristic. Then we apply the extracted feature vector to decision trees to construct random forests, which are an ensemble of random decision trees. Using the random forests with local WCS-LBP, we classified one test image into the category having the maximum posterior probability. Compared with other feature descriptors and classifiers, the proposed method shows both improved performance and faster processing time.
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