Test logic reuse through unit test patterns a test automation framework for software product lines

摘要

Software product line (SPL) brings benefits such as lower time-to-market, less development costs, increased productivity and improved quality. The quality assurance can be reached through the testing area, however this area still has challenges and gaps in the SPL development. Since not all testing techniques used in a single product development can be applied to SPL, because of artifacts variabilities, further adaptations and new proposals are required. Our proposal thus is to adapt some unit tests patterns to SPL needs. The Test Automation Framework and Data-Driven Test patterns can provide the reuse of test logic and the automation of implementation mechanisms, reducing the effort required to test the variations of each application. Thus, we propose the Data-Driven Test Automation Framework to be used during the application engineering to configure the tests through Parameterized Tests and verify the correctness of the generated applications. An example of a SPL is also presented.