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Degradation Behaviors of Driving Thin-Film Transistors in Active-Matrix Organic Light-Emitting Diode Displays

机译:有源矩阵有机发光二极管显示器中驱动薄膜晶体管的退化行为

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摘要

The reliability of driving TFTs of an AMOLED display is investigated and studied. The simulated driving voltage stress is proposed and applied in poly-Si TFTs. The degradation shows a two-stage degradation behavior. Incorporated with transient simulation, the degradation mechanisms are tentatively discussed.
机译:研究了驱动AMOLED显示器的TFT的可靠性。提出了模拟驱动电压应力并将其应用于多晶硅TFT。降解表现出两阶段的降解行为。结合瞬态仿真,初步讨论了降解机理。

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