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Detector Performance of Ammonium-Sulfide-Passivated CdZnTe and CdMnTe Materials

机译:硫化铵钝化的CdZnTe和CdMnTe材料的检测器性能

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Dark currents, including those in the surface and bulk, are the leading source of electronic noise in X-ray and gamma detectors, and are responsible for degrading a detector's energy resolution. The detector material itself determines the bulk leakage current; however, the surface leakage current is controllable by depositing appropriate passivation layers. In previous research, we demonstrated the effectiveness of surface passivation in CZT (CdZnTe) and CMT (CdMnTe) materials using ammonium sulfide and ammonium fluoride. In this research, we measured the effect of such passivation on the surface states of these materials, and on the performances of detectors made from them.
机译:暗电流,包括表面和主体中的暗电流,是X射线和伽马探测器中电子噪声的主要来源,并且会降低探测器的能量分辨率。探测器材料本身决定了整体泄漏电流;然而,通过沉积适当的钝化层可以控制表面泄漏电流。在先前的研究中,我们证明了使用硫化铵和氟化铵在CZT(CdZnTe)和CMT(CdMnTe)材料中进行表面钝化的有效性。在这项研究中,我们测量了这种钝化对这些材料的表面状态以及由它们制成的探测器性能的影响。

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