首页> 外文会议>Gettering and defect engineering in semiconductor technology XIV >Application of double crucible in Cz Si crystal growth
【24h】

Application of double crucible in Cz Si crystal growth

机译:双坩埚在Cz Si晶体生长中的应用

获取原文
获取原文并翻译 | 示例

摘要

Numerical modeling of melt flow, heat transfer and impurity (phosphorus) diffusion in the double crucible of a "Redmet-90M" Cz puller was carried out in an application to a 200 mm diameter Si single crystal growth. The double crucible consists of two coaxial crucibles having different sizes: 490 mm (external) and 300 mm (internal) inner diameters. The bottom of the internal crucible has a central hole of D_o = 6 and 12 mm diameter for melt inflow from the external crucible. During crystal pulling the granulated Si was added in the external crucible and a melt of the internal crucible was doped by phosphorus. Three-dimensional features of a rotating melt flow affecting heat transfer and impurity diffusion in the internal crucible were analyzed. In particular, the melt precession and thermal asymmetry near the liquid-solid interface (LSI) in the internal crucible are discussed. It is shown that a significant phosphorus losses caused by its evaporation from a melt surface may be compensated by additional phosphorus doping in the internal crucible.
机译:在应用于直径为200 mm的Si单晶生长的应用中,对“ Redmet-90M” Cz拉拔器的双坩埚中的熔体流动,传热和杂质(磷)扩散进行了数值模拟。双坩埚由两个不同尺寸的同轴坩埚组成:内径为490毫米,内径为300毫米。内坩埚的底部有一个D_o = 6的中心孔,直径为12 mm,用于从外坩埚流入的熔体。在拉晶过程中,将粒状硅添加到外部坩埚中,并且内部坩埚的熔体被磷掺杂。分析了影响内部坩埚内传热和杂质扩散的旋转熔体流动的三维特征。特别地,讨论了内部坩埚中液固界面(LSI)附近的熔体进动和热不对称性。结果表明,内部坩埚中额外的磷掺杂可以补偿由于磷从熔体表面蒸发而导致的大量磷损失。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号