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Influence of uniaxial pressure on the photoionization of h-centers in semiconductors

机译:单轴压力对半导体中h中心光电离的影响

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摘要

Abstract: Photoionization cross section of holes localization on deep centers with short distance potential at their transitions to the valence band of the uniaxially deformed semiconductor like Ge has been calculated. Because of splitting both acceptor level and extremum of hole subbands, photoionization threshold splits also - four kinds of such transitions appear. While growing temperature, the alteration of population of splitted impurity states occurs. It result in changing contribution of each kind of transitions to the absorption coefficient. As deformation disturbs spherical symmetry of the problem, appreciable polarization dependence of absorption coefficient appears. The calculation is based on the general quantum mechanic formula with transition matrix element using wave function of impurity center under deformation. !10
机译:摘要:计算了空穴在深中心的光电离截面,该中心在向Ge等单轴变形半导体的价带跃迁时具有短距离电势。由于分裂了受主能级和空穴子带的极值,光电离阈值也分裂了-出现了四种此类跃迁。随着温度的升高,发生分裂的杂质态种群的变化。这导致各种跃迁对吸收系数的贡献发生变化。由于变形干扰了问题的球形对称性,因此出现了吸收系数的明显偏振依赖性。该计算是基于具有过渡矩阵元素的通用量子力学公式,该公式使用了变形时杂质中心的波动函数。 !10

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