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Nanometric edge profile measurement of cutting tools on a diamond turning machine

机译:金刚石车床上切削刀具的纳米边缘轮廓测量

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摘要

Single crystal diamond tools are used for fabrication of precision parts [1-5]. Although there are many types of tools that are supplied, the tools with round nose are popular for machining very smooth surfaces. Tools with small nose radii, small wedge angles and included angles are also being utilized for fabrication of micro structured surfaces such as microlens arrays [6], diffractive optical elements and so on. In ultra precision machining, tools are very important as a part of the machining equipment. The roughness or profile of machined surface may become out of desired tolerance. It is thus necessary to know the state of the tool edge accurately. To meet these requirements, an atomic force microscope (AFM) for measuring the 3D edge profiles of tools having nanometer-scale cutting edge radii with high resolution has been developed [7-8]. Although the AFM probe unit is combined with an optical sensor for aligning the measurement probe with the tools edge top to be measured in short time in this system, this time only the AFM probe unit was used. During the measurement time, that was attached onto the ultra precision turning machine to confirm the possibility of profile measurement system.
机译:单晶金刚石工具用于制造精密零件[1-5]。尽管提供了多种类型的刀具,但是圆角的刀具仍可用于加工非常光滑的表面。鼻半径小,楔角小和夹角小的工具也被用于制造微结构表面,例如微透镜阵列[6],衍射光学元件等。在超精密加工中,刀具作为加工设备的一部分非常重要。机加工表面的粗糙度或轮廓可能会超出所需的公差。因此有必要准确地知道刀沿的状态。为了满足这些要求,已经开发了一种原子力显微镜(AFM),用于测量具有高分辨率的纳米级切削刃半径的工具的3​​D边缘轮廓[7-8]。尽管在该系统中,AFM探针单元与光学传感器组合在一起,可以在短时间内将测量探针与要测量的工具刀沿对齐,但这次仅使用了AFM探针单元。在测量期间,将其安装在超精密车床上以确认轮廓测量系统的可能性。

著录项

  • 来源
  • 会议地点 Shenyang(CN);Shenyang(CN)
  • 作者单位

    Nano-Metrology and Control Laboratory, Department of Nanomechanics, School of Engineering,Tohoku University, Aramaki Aoba 6-6-01, Aoba-ku, Sendai, Myagi 980-8579, JAPAN;

    Nano-Metrology and Control Laboratory, Department of Nanomechanics, School of Engineering,Tohoku University, Aramaki Aoba 6-6-01, Aoba-ku, Sendai, Myagi 980-8579, JAPAN;

    Nano-Metrology and Control Laboratory, Department of Nanomechanics, School of Engineering,Tohoku University, Aramaki Aoba 6-6-01, Aoba-ku, Sendai, Myagi 980-8579, JAPAN;

    Nano-Metrology and Control Laboratory, Department of Nanomechanics, School of Engineering, Tohoku University, Aramaki Aoba 6-6-01, Aoba-ku, Sendai, Myagi 980-8579, JAPAN;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 真空测试及仪器;
  • 关键词

    atomic force microscope (AFM); diamond cutting tool;

    机译:原子力显微镜(AFM);钻石切割工具;

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